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LT2200E
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Linkoptik LT2200E Laser Diffraction System
The LT2200E system provides the ability to measure over a maximum size range of 0.1 - 1200 microns using a single lens and includes a solid-state laser (max 20 mW, 638 nm) and laser power monitor along with a unique optical path configuration and a 3-D multi-element silicon photo-diode array covering a large, continuous physical detection angle with no dead detection zone.
The spatial filter and polarization combined with optical fiber technology eliminates the need for a pinhole. Parallel and tilted cell windows provide elimination of total reflection and the multi-element detector array ensures automatic and rapid alignment.
The software includes correction of the anomalous change of airy disk (ACAD) and an improved inversion algorithm with high resolution and sensitivity at a data acquisition rate of up to 20 kHz.
The LT2200E system provides the ability to measure over a maximum size range of 0.1 - 1200 microns using a single lens and includes a solid-state laser (max 20 mW, 638 nm) and laser power monitor along with a unique optical path configuration and a 3-D multi-element silicon photo-diode array covering a large, continuous physical detection angle with no dead detection zone.
The spatial filter and polarization combined with optical fiber technology eliminates the need for a pinhole. Parallel and tilted cell windows provide elimination of total reflection and the multi-element detector array ensures automatic and rapid alignment.
The software includes correction of the anomalous change of airy disk (ACAD) and an improved inversion algorithm with high resolution and sensitivity at a data acquisition rate of up to 20 kHz.
> Size range 0.1 μm - 1200 μm with no need for lens change
> Solid-state laser light source with automatic temperature stabilizing system
> Spatial filter and polarization combined with optical fiber technology, no pinhole needed
> Unique optic configuration with large angle detector array, no dead detection zone within angular range
> Dual-drive dispersion and integration technology
> Continuous dispersant level sensing and control
> Correction of anomalous change of airy disk (ACAD) in diffraction
> Improved inversion algorithm and self-adaptive technique with high resolution and sensitivity
> Data acquisition rate up to 20 kHz
> Fully complies with ISO13320 standard
> Solid-state laser light source with automatic temperature stabilizing system
> Spatial filter and polarization combined with optical fiber technology, no pinhole needed
> Unique optic configuration with large angle detector array, no dead detection zone within angular range
> Dual-drive dispersion and integration technology
> Continuous dispersant level sensing and control
> Correction of anomalous change of airy disk (ACAD) in diffraction
> Improved inversion algorithm and self-adaptive technique with high resolution and sensitivity
> Data acquisition rate up to 20 kHz
> Fully complies with ISO13320 standard
Specification |
Value |
Measuring Principle |
Laser light scattering |
Analysis |
Full Mie theory and Fraunhofer scattering |
Size range |
0.1 μm - 1200 μm, No need for lens change and calibration |
Detection System |
Large angle detector array with area compensation, no dead detection zone within angular range |
Cell Windows |
Parallel and tilted |
Light Source |
Max 20 mW, 638 nm solid-state laser with integrated thermostat |
Spatial Filter |
OF Filter with polarization |
Optical alignment system |
Smart rapid align system with full automation |
Typical measurement time |
Less than 10 seconds |
Data acquisition rate |
Up to 20 kHz |
Accuracy |
Better than 0.6% (the mean size of NIST latex standard) |
Repeatability |
Better than 0.5% (sample and sample preparation dependent) |
Optical system weight |
25 kg |
Optical system dimensions |
670 mm x 275 mm x 320 mm |
