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LT3600 Plus
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Linkoptik LT3600 Plus Laser Diffraction System
The system provides the ability to measure over a maximum size range of 0.015 - 3600 microns using a single lens and includes a solid-state laser (max 20mW, 638nm) and laser power monitor along with a unique optical path configuration and a 3-D multi-element silicon photo-diode array covering an extra-large, continuous physical detection angle with no dead detection zone.
High sensitivity backscatter detectors are integrated for improvement of size measurement in the lower size range. Spatial filter and polarization combined with optical fiber technology eliminates the need for a pinhole.
Tilted and trapezoid cell windows provide continuous measurement in an extra-large angle range and elimination of total reflection, while the multi-element detector array ensures automatic and rapid alignment.
The software comprises correction of anomalous change of airy disk (ACAD) and an improved inversion algorithm with high resolution and sensitivity at a data acquisition rate of up to 20kHz.
The system provides the ability to measure over a maximum size range of 0.015 - 3600 microns using a single lens and includes a solid-state laser (max 20mW, 638nm) and laser power monitor along with a unique optical path configuration and a 3-D multi-element silicon photo-diode array covering an extra-large, continuous physical detection angle with no dead detection zone.
High sensitivity backscatter detectors are integrated for improvement of size measurement in the lower size range. Spatial filter and polarization combined with optical fiber technology eliminates the need for a pinhole.
Tilted and trapezoid cell windows provide continuous measurement in an extra-large angle range and elimination of total reflection, while the multi-element detector array ensures automatic and rapid alignment.
The software comprises correction of anomalous change of airy disk (ACAD) and an improved inversion algorithm with high resolution and sensitivity at a data acquisition rate of up to 20kHz.
> Size range 0.015 μm -- 3600 μm with no need for lens change
> Solid-state laser light source with automatic temperature stabilizing system
> Spatial filter and polarization combined with optical fiber technology eliminates the need for a pinhole
> Tilted and trapezoid cell windows
> Integrated high sensitivity backscatter detectors
> Unique optic configuration with an extra-large angle detector array, no dead detection zone within the angular range
> Dual-drive dispersion and integration technology
> Continuing dispersant level sensing and control
> Correction of anomalous change of airy disk (ACAD) in diffraction
> Improved inversion algorithm and self-adaptive technique with high resolution and sensitivity
> Data acquisition rate up to 20kHz
> Fully complies with ISO13320 standard
> Solid-state laser light source with automatic temperature stabilizing system
> Spatial filter and polarization combined with optical fiber technology eliminates the need for a pinhole
> Tilted and trapezoid cell windows
> Integrated high sensitivity backscatter detectors
> Unique optic configuration with an extra-large angle detector array, no dead detection zone within the angular range
> Dual-drive dispersion and integration technology
> Continuing dispersant level sensing and control
> Correction of anomalous change of airy disk (ACAD) in diffraction
> Improved inversion algorithm and self-adaptive technique with high resolution and sensitivity
> Data acquisition rate up to 20kHz
> Fully complies with ISO13320 standard
Specification |
|
Measuring Principle |
Laser light scattering |
Analysis |
Full Mie theory and Fraunhofer scattering |
Size range |
0.015 μm - 3600 μm, No need for lens change and calibration |
Detection System |
Extra-large angle detector array with area compensation and gridded holder, no dead detection zone within angular range, integrated high sensitivity back scatter detectors |
Cell Windows |
Tilted and trapezoid cell windows |
Light Source |
Max 20 mW, 638 nm solid-state laser with integrated thermostat |
Spatial Filter |
OF Filter with polarization |
Optical alignment system |
Smart rapid align system with full automation |
Typical measurement time |
Less than 10 seconds |
Data acquisition rate |
Up to 20 kHz |
Accuracy |
Better than 0.6% (the mean size of NIST latex standard) |
Repeatability |
Better than 0.5% (sample and sample preparation dependent) |
Optical system weight |
28.5 kg |
Optical system dimensions |
636 mm x 275 mm x 320 mm |
